 |
0 索取号:TP3/E9019 作者:NATO Advanced Research Workshop on High-Speed Computation (1983 : J̈Уlich、 Germany)、Kowalik、 Janusz S.、North Atlantic Treaty Organization. Scientific Affairs Division.、 出版社:Berlin ; New York : Springer-Verlag, 1984.
|  |
0 索取号:TP29-53/E903/1985 作者:Office Automation Conference (1985 : Atlanta、 Ga.)、American Federation of Information Processing Societies.、 出版社:Reston, Va. : American Federation of Information Processing Societies, c1985.
|
 |
0 索取号:TP29-53/E904/1 作者:IEEE International Conference on Office Automation (1st : 1984 : New Orleans、 La.)、Taylor、 R. W. (Robert William)、 1932-、Institute of Electrical and Electronics Engineers.、 出版社:Silver Spring, MD : IEEE Computer Society Press ; Los Angeles, CA : Order from IEEE Computer Society, 1984.
|  |
0 索取号:TP29-53/E991/1992.1 作者:IEEE International Symposium on Industrial Electronics (1st 1992 : Xi'an、 Shaanxi Sheng、 China)、IEEE Industrial Electronics Society.、 出版社:Xian Holiday Inn. Piscataway, NJ : IEEE Service Center, 1992.
|
 |
0 索取号:TP274-53/E801/1977 作者:International Conference on New Developments in Automatic Testing、 Brighton、 Eng.、 1977.、Institution of Electrical Engineers. Control and Automation Division.、Institution of Electrical Engineers. Electronics Division.、 出版社:London : The Institution, 1977.
|  |
0 索取号:TP273-53/E808 作者:UKAC Control Convention、 4th、 University of Manchester、 1971.、United Kingdom Automation Council.、Institution of Electrical Engineers.、University of Manchester.、 出版社:London, Institution of Electrical Engineers, 1971.
|
 |
0 索取号:TP273-53/E801 作者:Numerical Control Society.、De Vries、 Mary Ann、 ed.、 出版社:N.Y> Numerical Centrol Society [Spring Lake, N.J., 1973]
|  |
0 索取号:TP271.7/E801/3.2 作者:IFAC Symposium on Identification and System Parameter Estimation (3rd : 1973 : Delft University of Technology)、Eykhoff、 Pieter、 1929- ed.、Instituut van Ingenieurs. Division for Automatic Control.、International Federation of Automatic Control.、International Federation of Automatic Control. Technical Committee on Theory.、International Federation of Automatic Control. Technical Committee on Applications.、 出版社:London Amsterdam, North-Holland Pub. Co.; New York, American Elsevier, 1973.
|
 |
0 索取号:TP271/E901 作者:Leigh、 J. R. (James R.)、 出版社:London Englewood Cliffs, N.J. : Prentice-Hall International, 1985.
|  |
0 索取号:TP27-53/E902 作者:European Conference on Electronic Design Automation (1984 : University of Warwick)、Institution of Electrical Engineers. Electronics Division.、British Computer Society.、 出版社:London ; New York : Venue The Institution of Electrical Engineers, 1984.
|
 |
0 索取号:TP252-53/E901/1986.3 作者:IEEE International Conference on Robotics and Automation (1986 : San Francisco、 Calif.)、IEEE Robotics and Automation Council.、IEEE Computer Society.、 出版社:Washington, D.C. : IEEE Computer Society Press ; Los Angeles, CA : Order from IEEE Computer Society, 1986.
|  |
0 索取号:TP252-53/E901/1986.2 作者:IEEE International Conference on Robotics and Automation (1986 : San Francisco、 Calif.)、IEEE Robotics and Automation Council.、IEEE Computer Society.、 出版社:Washington, D.C. : IEEE Computer Society Press ; Los Angeles, CA : Order from IEEE Computer Society, 1986.
|
 |
0 索取号:TP252-53/E901/1986.1 作者:IEEE International Conference on Robotics and Automation (1986 : San Francisco、 Calif.)、IEEE Robotics and Automation Council.、IEEE Computer Society.、 出版社:Washington, D.C. : IEEE Computer Society Press ; Los Angeles, CA : Order from IEEE Computer Society, 1986.
|  |
0 索取号:TP252-53/E901/1985 作者:IEEE International Conference on Robotics and Automation (1985 : St. Louis、 Mo.)、IEEE Computer Society.、Institute of Electrical and Electronics Engineers.、 出版社:Silver Spring, MD : IEEE Computer Society Press ; Los Angeles CA : Order from IEEE Computer Society, 1984.
|
 |
0 索取号:TP216-53/E901/1985 作者:IEEE International Automatic Testing Conference (1985 : Fort Worth、 Tex.)、Institute of Electrical and Electronics Engineers.、 出版社:New York, NY : Institute of Electrical and Electronics Engineers ; Piscataway, NJ : Copies from Order Dept., IEEE, 1985.47,c1983.
|  |
0 索取号:TP216-53/E901/1982 作者:IEEE International Automatic Testing Conference (1982 : Dayton、 Ohio)、Institute of Electrical and Electronic Engineers.、 出版社:New York, N.Y. (345 E. 47th St., New York 10017) : IEEE, c1982.
|